Comparing SHAP and CRAFT Across Architectures for PEMFC SEM Images
Cross-architecture comparison of SHAP and CRAFT on PEMFC catalyst SEM images for degradation classification. Co-authored with KIER's analysis and hydrogen fuel cell teams.
Hyoeun Choi
Undergraduate Research Intern
Chungnam National University · Visiting via Baekma Internship 2026
Hyoeun is an undergraduate research intern at DAIS through the Baekma Internship
program (Spring 2026). Her research focuses on explainable AI (XAI) — comparing
GradCAM, LIME, SHAP, and CRAFT methods on semiconductor defect analysis images.
She joined the group via a collaboration with KIER’s Materials Test & Analysis Lab.